TEL Deep Trench Silicon Etcher-TELIUS SP 308 QS
(More information: [email protected]
http://www.globalnanotechequipment.com)
Manufacturer:Tel
Model:TEL Deep Trench Silicon Etcher-TELIUS SP 308QS
Condition:Used,complete,crated,working before crating.
Amount:3 sets
TEL Deep Trench Silicon Etcher Model: TELIUS SP 308 QS ETCH TOOL, (4) CHAMBERS, 5 loader ports, 300mm FOUP, Load Locker Modules,4 Deep Trench Silicon Etcher (SCCM) Super Capacitively Coupled Module Chambers,40MHz and 3.2MHz dual Frequency Source (GEW3040 and NOVA50A),ESD chuck, Temperature Control.
Specifications
- Chamber: Aluminum Alloy Chamber, Aluminum Alloy (A6061), Hard Sulfuric Acid Anodizing Surface finishing.
- RF application method: Apply upper RF to lower electrode, SCCM Type Discharge method.
- Temperature control: Apply upper RF to lower electrode;
- Upper electrode: Upper electrode is by Heater and Cooling Water. Lower electrode is by circulating coolant. Side wall is by heater.
- Upper electrode: Quartz Cover or Aluminum Alloy(A6061) with Hard Sulfuric Acid Anodizing.
- Shield ring:
- Lower electrode: Ceramics electro static chuck with Thermometer. Wafer holding method is Electrostatic chuck(φ300) mechanism.
- Focus ring :Quartz.
- Exhaust Plate: Aluminum Alloy with Hard Sulfuric Acid Anodizing.
- Insulation ring: Quartz Cover or Aluminum Alloy(A6061) with Hard Sulfuric Acid Anodizing.
- Distance between electrodes: 30~35 mm.
- Magnet: Intensity:170G(center), Rotation:20+-1rpm.
- Pressure monitor: Each chamber has following three kind of pressure monitor.
- He B.P UNIT: Cooling Gas for Wafer back, PCV(STEC) Pressure Switch, Two lines line/control (Center/Edge),0~7980Pa(0~60Torr) range of pressure, He Leakage monitor, VALVE ON/OFF sensor for Detection of valve open/close.
- End point detection : SE2000.
- Confirmation of luminescence.
- WINDOW: Orifice(Quartz).
- Deposition shield: Use removable depo-shield(The material is quartz) for easy cleaning of process chamber.
- Shutter: Aluminium Alloy with Hard Sulfuric Anodizing Plate, Air Cylinder Drive.
- Final Valve: Diaphragm Type MEGA-One (Fujikin)
- APC
- Manifold: Aluminium Alloy with Hard Sulfuric Anodizing
- O-ring for Chamber:: Chemratz
- Specifications for performance: (1)Ultimate Vacuum: 0.0133 Pa(7.5*10-2 mTorr) or less; (2)Leak Back:0.133 Pa/min(1 mTorr/min) or less.
Attachments:
TEL Deep Trench Silicon Etcher-TELIUS SP 308 QS.jpg (https://www.engagez.net/system/files/TEL%2BDeep%2BTrench%2BSilicon%2BEtcher-TELIUS%2BSP%2B308%2BQS.jpg) 41.93 KB